Abstract template for the 12th ASEM Workshop 2022

A. Author1, B. Author2, C. Author1

1Center for Surface and Nanoanalytics, Johannes Kepler University Linz,
Altenberger Str. 69, 4040 Linz, Austria
2Affiliation 2, Address, Country

This is the template for the abstract intended for submission to the 12th ASEM Workshop 2022, which will be taking place in the JKU Linz, Upper Austria, from April 20th to 21st, 2022. Please, prepare your abstract in English as a doc file according to the following guidelines or just copy-paste your text and use dedicated styles. You can find the ASEM styles’ presets that we stored for your convenience in the ‘styles’ section.

The abstract is limited to one page with optional figures (Figure 1) with corresponding captions. The page should be set to A5 with 2 cm left, 0.8 cm right, and 1 cm top and bottom margins, or just stick to this template. Please, use a Calibri font throughout. The title should be centered and typed in 10pt and bold. The author list (9pt) and authors’ affiliations (8 pt) are centered. The affiliations should be typed in italics. There is a line spacing of 6pt between the authors list and affiliations. A 12pt spacing is between title and authors/affiliations and between authors/affiliations and the main text. Please, underline the presenting author in the author list and mark the corresponding author with an asterisk (*) as superscript. The corresponding author's email address should be written as a footnote at the end of the text page in 8pt. The main text should be justified and typed in 9pt. The references at the end of the text typed in 8pt and justified are referred to in the text with numbers in square brackets [1]. Please, use the style as shown here [1,2] and leave one line empty between text and references.

Figure 1. You can optionally present figures that should appear centered on the page with a centered and justified figure captions (8pt) underneath. Please, use figures with a resolution of at least 300 dpi.

D. Author, E. Author, F. Author, et al., Journal Title, 1 (2), 666 (2022)

D.B. Williams, C.B. Carter, High-Resolution TEM. In: Transmission Electron Microscopy, Springer, Boston (2009)

Corresponding author: email: a.author@institute.at