We have a strong expertise in electrical metrology at the nanoscale based on scanning probe microscopy and other characterization techniques. We develop new techniques/ methods and apply them to solve open research questions in various fields like Biophysics, Electrochemistry, Material Science and Semiconductor-Physics - always with the focus on Nanoscience. The special technological emphasis on broad frequency and high speed electrical measurements at the nanoscale is combined with the development of accurate and numerical quantification procedures based on finite element modelling. 

• Atomic Force Microscoopy 
• Scanning Microwave Microscopy
• Time Resolved Electrostatic Force Microscopy
• Broad Band Electrostatic Force Microscopy
• Electrochemical Microwave Scanning Tunneling Microscopy 

Metrology Institutions: Johannes Hoffmann (Metas Bern, CH), A. Schönhals (BAM - GER), Gabriel Aeppli (Paul Scherer Institute - CH)

Universities: Peter Pohl (JKU-AT), Stefan Müllegger (JKU-AT), Neil Curson (University College London - UK), Andrea Ferrari (Cambridge Graphene Centre - UK), Gabriel Gomila (IBEC - ESP), Didier Theron (IEMN - F), Romolo Maricelli (CNR Rome - IT), Gabriel Aeppli (EPFL, ETH Zurich CH)

Industrial companies: Ferry Kienberger (Keysight Labs- AT), Andreas Fuhrer (IBM Zurich - CH), Nicolas Clement (NTT - Tokyo Japan) 

2021-2024 EMPIR EC H2020, ELENA Electrical nanoscale metrology in industry. eSPM techniques for semiconductor and materials.

2020-2023 NMBP EC H2020, PI JKU G. Gramse, Title: NanoBat, 
GHz nanoscale electrical and dielectric measurements 
of the SEI and applications in the battery manufacturing 
line. JKU amount: 427.500€. 

2019-2020 Attract EC H2020, PI G. Gramse, 
Title: Hardware module for single Ion channel 
spectroscopy with 100ps time resolution. 
Amount: 100.000€

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